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Cross-Temperature Defect Identification in Atomistic Simulations via Multi-Level Domain Alignment

Occurred
Aug 22, 2026
Published
Aug 22, 2026
Source
arXiv

Summary

Identifying atomic defects at elevated temperature is difficult because thermal fluctuations blur the local symmetry that both geometric heuristics and supervised classifiers rely on: trustworthy labels exist in low-temperature reference configurations, while the high-temperature regime where robust analysis matters most is effectively unlabeled. We cast this as a cross-temperature domain-shift problem and align the two domains at three levels: an equivariant denoiser at the input level, cross-temperature contrastive learning at the representation level, and a morphology-aware regularizer that steers predictions toward the compact geometry of physical defect structures. Because no atom-wise truth exists at temperature, we further introduce a label-free evaluation suite that scores predicted defect structures along five spatial and physics-based axes, enabling model assessment and selection without high-temperature labels. Near the melting point, the framework identifies vacancies and self-interstitial atoms across face-centered-cubic, body-centered-cubic, and hexagonal-close-packed iron systems with every interstitial localized and zero false detections in every vacancy system against Wigner-Seitz ground truth, with no high-temperature labels used in training. It sustains this fidelity on a million-atom, 2.5 ns trajectory, resolving single vacancy hops and complete Frenkel-pair recombination, and captures grain-boundary phase transformations in aluminum bicrystals, distinguishing two nucleation modes. Multi-level domain alignment thus offers a practical, label-efficient route to temperature-robust structural analysis of large-scale molecular dynamics.

Classification

Category confidence: 95%
Severity confidence: 95%

Rationale: Research paper on AI for materials science simulation with no reported safety incident or harm.

Classifier: Qwen/Qwen3.5-35B-A3B-FP8

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